EN

GEMV 510

Our Competitive Edges of GEMV510
  • Semiconductor-grade SMT/SIP Inspection

  • Flip Chip Inverted Process Inspection

  • Testing of Various Adhesive

  • Gold Finger Soldering Test

  • Seal Text Detection

  • Aluminium Wire and Gold Wire Testing

Introduction to 3D AOI Semiconductor-grade SMT/SIP Testing
  • Square positioning - The 3D positioning algorithm is used to test component height, component size, component offset angle, and other parameters.

  • Colour Analysis - 2D colour algorithms test for component defects by extracting grayscale values of the three primary colours.

  • Solder Joint Inspection - A 3D+2D solder joint algorithm is used to test soldering effectiveness by measuring solder joint ramp height and solder joint colour.

  • Flatness Inspection - A 3D height algorithm measures the flatness of a component by calculating the height differences between different areas of the component body.

Semiconductor-grade SMT/SIP Inspection

Algorithm Analysis for CHIP-type Microdevice Detection


GEMV510 Product Feature (3).png

Flip Chip Inverted Process Inspection

FC Component Detection Algorithm Analysis


Screenshot 2026-06-02 at 1.02.26 PM.png



DIE/Chip Detection Algorithm Analysis



Screenshot 2026-06-02 at 1.04.29 PM.png


Analysis of Chip Damage Detection Algorithm


GemV510 Product Feature (4).png


Line positioning The 2D grayscale algorithm calculates the height and width of the maximum area by detecting the maximum area of the gaps on both sides of a straight line.



Analysis of Chipping Damage Detection Algorithms: 2D/3D Detection Algorithms

Right angle detection - 2D & 3D grayscale algorithms detect the area of right-angle defects by calculating the angle between two lines.



Screenshot 2026-06-02 at 1.28.37 PM.png

Testing of Various Adhesive

Detection of adhesives containing fluorescent agents


Analysis of Fluorescent Agent Glue Detection Algorithm -- 2D Colour Analysis

The 2D colour analysis algorithm, using a special light source, can clearly distinguish the glue application area. Then, the colour analysis algorithm calculates the glue area and detects defects such as insufficient glue or glue overflow.


GEMV510 Product Feature (5).png

Gold Finger Soldering Test

Analysis of Solder Adhesion Detection Algorithm for Gold Fingers - Wire Bonding Solder Joints


Screenshot 2026-06-02 at 1.41.16 PM.png



Gold finger soldering test RS service station fault confirmation interface


Screenshot 2026-06-02 at 1.43.23 PM.png


Analysis of the solder immersion detection algorithm for gold fingers; effect diagrams at different resolutions; gold finger pin pads.


Screenshot 2026-06-02 at 1.48.23 PM.png

Seal Text Detection

Detection of stamp text after moulding


Gem Vision AOI employs diverse image computation schemes, including Optical Character Verification (OCV), Optical Character Recognition (OCR), and Image & Color Matching algorithms. The programming steps are simple and clear, with well-defined and consistent parameters.


GEMV510 Product Feature (6).png


Overall framework import solution (Support Automatic Import of framework files and manual programming)

Screenshot 2026-06-02 at 2.15.44 PM.png

Aluminium Wire and Gold Wire Testing

Analysis of Wire Bonding Detection Algorithms


Screenshot 2026-06-02 at 2.21.18 PM.png


Analysis of Wire Bonding Detection Algorithms - Golden Ball



image.jpeg


3D Moulding Inspection for Wire Bonding 


Screenshot 2026-06-02 at 2.26.37 PM.png


Analysis of Wire Bonding Detection Algorithms


image.png


Chip Inspection Algorithm - Chips Positioning, Flatness Detection, Silver Paste Detection


Screenshot 2026-06-02 at 2.41.47 PM.png


IGBT Aluminium Wire Testing


AI Algorithms automatically recognises lines, eliminating the need for manual drawings of outlines.


Screenshot 2026-06-02 at 2.45.45 PM.png


It can test defects such as the shape, size and offset of bonding points


Screenshot 2026-06-02 at 2.48.22 PM.png

Aluminium Wire Height Detection Algorithm - 3D Line testing


Screenshot 2026-06-02 at 2.50.35 PM.png

Technology PlatformStandard TYPE - C 
SeriesGEMV 
ModelGEMV 510
Measurement Principle3D white light PSLM PMP (Programmable Spatial Light Modulation, Phase Measurement Profilometry)
Measurements

Defective Component, Defective Chip, Defective Golden Finger, Poor Glue Quantity, Defective Seal after Plastic Sealing

Detection of Non-Performing Types

Defective Components (Missing Parts, Offset, Rotation, Three-Dimensional Polarity, Reverse Parts, OCV, Tilted, Side-mounted, Tombstone, Poor Welding, etc)

Defective Chip (Missing Core, Offset, Rotation Chipping, Crack, Flatness, Contamination, etc)

FOV Size20mm X 15mm (12M 5μm) optional: 1.8μm, 3.1μm, 7μm, 10μm Resolution and 1600W, 2000W Camera
AccuracyXY (Resolution): 10μm (5μm Optional)
RepeatabilityHeight: ≤1μm (4 Sigma)
Gage R&R<10%
Inspection Speed

0.5 Sec/FOV

2D Light SourceMulti-angle, Multi-zone, Three colour 2D Light Source (RGB+W)
Mark-point Detection Time0.3sec/piece
Loader & Unloader

Directly connected to the docking station (Optional large-capacity weak-clamp material box for fully automatic loading and unloading, 4 material box can be entered and exited at the same time)

Bar-code ReadSupport 1D/2D Barcode Reading
Traceability SystemSupport automatic generation of mapping and upload SECS/GEM
Maximum Frame Vehicle Size450mmX450mm
Transfer DirectionLeft to right or Right to left
Conveyor Width Adjustment Manual & Automatic
Engineering StatisticsHistogram, Xbar-R Chart, Xbar-S Chart, CP & CPK, % Gage Repeatability Data, SPI , Daily,Weekly/Monthly Reports
ProgrammingSupport Manual and Automatic Programming
Operating System SupportWindows 10 loT Enterprise (64 bit)
Equipment Weight985Kg